Tektronix BSA175C BERTScope 17.5 Gb/s Bit Error Rate Analyzer

The Tektronix BSA175C is a high-performance Bit Error Rate Tester (BERT) designed to support data rates up to 17.5 Gb/s. It is part of the BERTScope series, providing comprehensive signal integrity testing and characterization for high-speed digital communication systems. The BSA175C enables detailed bit error rate detection and analysis, making it a vital tool for engineers and technicians.

Key Features:

• High Data Rate Support: Capable of testing data rates from 1 Gb/s to 17.5 Gb/s, suitable for a wide range of high-speed communication standards.
• Accurate Jitter Measurement: Supports Total Jitter (TJ), Random Jitter (RJ), and Deterministic Jitter (DJ) measurements compliant with industry standards.
• Advanced Error Analysis: Provides deep error analysis capabilities, allowing users to isolate and debug problematic bit and pattern sequences.
• Flexible Clocking: Features a generator clock path with adjustable modulation options for Spread Spectrum Clocking (SSC) and supports sub-rate system clocks.
• Mask Compliance Testing: Enables detailed mask compliance contour testing, essential for standards such as XFP/XFI and OIF CEI.
• PatternVu Option: Includes advanced features like a software-implemented FIR filter for viewing eye diagrams after receiver equalization and CleanEye for removing nondeterministic jitter components.

Technical Specifications:

• Data Rate: 1 Gb/s to 17.5 Gb/s
• Clock Outputs: 1-17.5 GHz, with sub-rate clock outputs ranging from 0.250 to 3.575 GHz
• Jitter Analysis:
  • Sinusoidal Jitter (SJ): Internal frequency ranges from 1 kHz to 100 MHz
  • Total Jitter (TJ): Measures TJ including all jitter components
  • Random Jitter (RJ) and Deterministic Jitter (DJ): Separately measured
• Pattern Generation:
  • Memory depth: Flexible memory sequencing with two levels of loop nesting and up to 1 million iterations per loop
  • PatternVu: FIR filter implementation for eye diagram visualization post-equalization
• Mask Testing:
  • Depth advantage for eye diagrams, sampling every point on the perimeter of the mask
  • Compliance Contour view for mask overlay on measured BER contours
• Clock Recovery: Compatible with Tektronix CR125A, CR175A, and CR286A clock recovery instruments, ensuring accurate jitter measurement with compliant clock recovery

This unit is in good working condition and is tested to OEM critical specifications. Comes with a 30 day warranty, and we also offer a 7 day right of return (restocking fee may apply). We have been in business for over 25 years, our main focus is customer satisfaction by providing the highest quality of new or used test equipment. Please let us know if you have any questions.

We offer fast domestic and international shipping. We can ship on your FedEx, UPS, or DHL account upon request.  Lead time is typically 1-3 business days. Overseas customers, please consider duty’s and taxes before purchasing

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